Electron Microscopy (SEM, TEM)

Scanning Electron Microscopy (SEM):

Our JEOL JSM-6701F Field Emission Scanning Electron Microscope (FESEM) is installed with a field-emission fun and a specimen stage with three motorized axes. The accelerating voltage is adjustable from 0.5 to 30 kV. In addition to secondary electron detectors, it is also equipped with a retractable back-scattered electron detector. The system is also equipped with a JEOL JED-2300F Energy Dispersive Spectrometer (EDS). The following analyses are available for SEM:

• Secondary-electron imaging
• Backscattered-electron imaging (compositional and topograhical imaging)
• Size measurement (limiting to planar view measurement only)
• Elemental analysis and mapping by EDS

Transmission Electron Microscopy (TEM):

Our JEOL JEM-3011 Transmission Electron Microscope is installed with a LaB6 emitter and a Gatan Orius SC200 CCD camera. This system operates at an accelerating voltage of 300 kV. This system is also equipped with an Oxford Instruments X-Max 80T Energy Dispersive Spectrometer (EDS). The following analyses are available for TEM:

• Bright- and dark-field imaging
• Selected Area Electron Diffraction (SAED)
• High-resolution Imaging
• Elemental analysis by EDS

EM services is located at S8-01-01, please contact Cheng Liyan, Sherona or 6601-7401 for further information.